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nanoandmore/160AC-NA/160AC-NA-10/Box of 10 AFM Probes

Cantilever:

F: 300 kHz C: 26 N/m L: 160 µm

Applications:

Non-Contact / Standard Tapping Mode AFM Probes

Description:

The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface. 30 nm Al on the back side of the cantilever

AFM Tip:

shape: OPUS

height: 14 µm (12 - 16 µm)*

radius:

half cone angle: 0° front, 35° back, <9° side

AFM Cantilever:

shape: Beam

length: 160 µm (150 - 170 µm)*

width: 40 µm (38 - 42 µm)*

thickness: 4 µm (3.5 - 4.5 µm)*

force constant: 26 N/m (8 - 57 N/m)*

resonance frequency: 300 kHz (200 - 400 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

4000-520-616

info@ebiomall.com

周一至周五（9:00~18:00）

苏州工业园区星湖街218号（生物纳米园）A4-216

Cantilever:

Applications:

Description:

AFM Tip:

AFM Cantilever:

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