Cantilever:
F: 325 kHz C: 40 N/m L: 125 µm
Applications:
Non-Contact / Standard Tapping Mode AFM Probes
Description:
Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode. Backside Al coated. Coating thickness - 30 nm.
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilever:
shape: Beam length: 125 µm width: 30 µm thickness: 4 µm force constant: 40 N/m (20 - 80 N/m)* resonance frequency: 325 kHz (265 - 410 kHz)* * typical range
