Cantilever:

Applications:

Description:

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCL AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

The probe offers unique features:

• excellent tip radius of curvature
• highly doped silicon to dissipate static charge
• chemically inert
• high mechanical Q-factor for high sensitivity
• precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

AFM Tip:

AFM Cantilever: