nanoandmore/HQ:NSC35/tipless/Cr-Au/HQ:NSC35/tipless/Cr-Au-50/Box of 50 AFM Probes
Applications:
Tipless AFM Cantilevers and Cantilever Arrays
Description:
Probes of the 35/tipless series have three different tipless contact mode cantilevers on one side of the holder chip. They can be used in various applications.Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on both sides of the cantilever. The coating may cause cantilever bending within 3°. Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both sides of the cantilever.
AFM Tip:
shape: Tipless AFM Cantilevers:
Cantilever A shape: Beam length: 110 µm width: 35 µm thickness: 2 µm force constant: 8.9 N/m (2.7 - 24 N/m)* resonance frequency: 205 kHz (130 - 290 kHz)* Cantilever B shape: Beam length: 90 µm width: 35 µm thickness: 2 µm force constant: 16 N/m (4.8 - 44 N/m)* resonance frequency: 300 kHz (185 - 430 kHz)* Cantilever C shape: Beam length: 130 µm width: 35 µm thickness: 2 µm force constant: 5.4 N/m (1.7 - 14 N/m)* resonance frequency: 150 kHz (95 - 205 kHz)* * typical range
