Cantilever:
F: 13 kHz C: 0.18 N/m L: 450 µm
Applications:
Hardened / Enhanced Wear Resistance AFM ProbesNanoindentation and Lithography AFM Probes
Description:
Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer. Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilever:
shape: Beam length: 450 µm width: 50 µm thickness: 2 µm force constant: 0.18 N/m (0.06 - 0.4 N/m)* resonance frequency: 13 kHz (10 - 17 kHz)* * typical range
