Cantilever:

F: 190 kHz C: 48 N/m L: 225 µm

Applications:

High Aspect Ratio (HAR) AFM Probes

Description:

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping^™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

These probes offer unique features:

• length of the high aspect ratio portion of the tip > 2 µm
• typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along cantilever axis)
• half cone angle of the high aspect ratio portion typically < 5°
• excellent tip radius of curvature

Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

AFM Tip:

shape: High-Aspect-Ratio

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 225 µm (220 - 230 µm)*

width: 38 µm (33 - 43 µm)*

thickness: 7 µm (6.5 - 7.5 µm)*

force constant: 48 N/m (31 - 71 N/m)*

resonance frequency: 190 kHz (160 - 210 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.