Cantilever:
F: 70 kHz C: 2 N/m L: 240 µm
Applications:
Magnetic AFM Probes
Description:
The 240AC-MA is designed for Magnetic Force Microscopy (MFM) measurements. The hard magnetic tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface. Co alloy on the tip side of the cantilever, 30 nm Al on the back side of the cantilever
AFM Tip:
shape: OPUS height: 14 µm (12 - 16 µm)* radius: half cone angle: 0° front, 35° back, <9° side AFM Cantilever:
shape: Beam length: 240 µm (230 - 250 µm)* width: 40 µm (38 - 42 µm)* thickness: 2.6 µm (2.1 - 3.1 µm)* force constant: 2 N/m (0.6 - 3.9 N/m)* resonance frequency: 70 kHz (45 - 90 kHz)* * typical range
