Cantilever:
F: 2 MHz C: - L: 35 µmApplications:
Ultra High Frequency AFM ProbesLife Science AFM ProbesUltra High Frequency , Ultra Short AFM CantileversDescription:
Optimized positioning through maximized tip visibilityNanoWorld Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency of up to 1.5 MHz. This probe type combines outstanding sensitivity with fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.
Additionally, this AFM probe offers an excellent tip radius of curvature.The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.If needed, specific cantilever thicknesses can be selected within very narrow tolerances for an additional selection fee.
Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.