nanoandmore/HQ:NSC36/Pt/HQ:NSC36/Pt-50/Box of 50 AFM Probes
Applications:
Conductive AFM Probes
Description:
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They are suitable for different electrical measurements.Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm. The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilevers:
Cantilever A shape: Beam length: 110 µm width: 32.5 µm thickness: 1 µm force constant: 1 N/m (0.1 - 4.6 N/m)* resonance frequency: 90 kHz (30 - 160 kHz)* Cantilever B shape: Beam length: 90 µm width: 32.5 µm thickness: 1 µm force constant: 2 N/m (0.2 - 9 N/m)* resonance frequency: 130 kHz (45 - 240 kHz)* Cantilever C shape: Beam length: 130 µm width: 32.5 µm thickness: 1 µm force constant: 0.6 N/m (0.06 - 2.7 N/m)* resonance frequency: 65 kHz (25 - 115 kHz)* * typical range
