Applications:
Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes
Description:
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications. Backside Al coated. Coating thickness - 30 nm.
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilevers:
Cantilever A shape: Beam length: 110 µm width: 32.5 µm thickness: 1 µm force constant: 1 N/m (0.1 - 4.6 N/m)* resonance frequency: 90 kHz (30 - 160 kHz)* Cantilever B shape: Beam length: 90 µm width: 32.5 µm thickness: 1 µm force constant: 2 N/m (0.2 - 9 N/m)* resonance frequency: 130 kHz (45 - 240 kHz)* Cantilever C shape: Beam length: 130 µm width: 32.5 µm thickness: 1 µm force constant: 0.6 N/m (0.06 - 2.7 N/m)* resonance frequency: 65 kHz (25 - 115 kHz)* * typical range
