Cantilever:
F: 65 kHz C: 0.5 N/m L: 125 µm
Applications:
Force Modulation (FM) AFM ProbesLateral Force Mode AFM Probes (LFM)Non-Contact / Soft Tapping Mode AFM ProbesScanAsyst ®** PeakForce Tapping ™** AFM ProbesScanAsyst ®** PeakForce Tapping™** AFM Probes
Description:
Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™**. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces. Uncoated
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilever:
shape: Beam length: 125 µm width: 22.5 µm thickness: 1 µm force constant: 0.5 N/m (0.05 - 2.3 N/m)* resonance frequency: 65 kHz (25 - 120 kHz)* * typical range
