Cantilever:

F: 14 kHz C: 0.2 N/m L: 450 µm

Applications:

Contact Mode AFM Probes

Description:

Optimized positioning through maximized tip visibilityNanoWorld Arrow^™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.Additionally, this probe offers an excellent tip radius of curvature.The unique Arrow^™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest. Uncoated

AFM Tip:

shape: Arrow

height: 10 - 15 µm

radius:

AFM Cantilever:

shape: Beam

length: 450 µm (445 - 455 µm)*

width: 45 µm (40 - 50 µm)*

thickness: 2 µm (1.5 - 2.5 µm)*

force constant: 0.2 N/m (0.06 - 0.38 N/m)*

resonance frequency: 14 kHz (10 - 19 kHz)*

* typical range