Applications:
Hardened / Enhanced Wear Resistance AFM ProbesNanoindentation and Lithography AFM ProbesHardened / Enhanced Wear Resistance Tapping AFM Probes
Description:
Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They can be used in various applications.A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer. Wear-resistant coating with thickness 20 nm on the tipside of the cantilever. Al coating with thickness 30nm on the backside of the cantilever.
AFM Tip:
shape: Rotated height: 15 µm (12 - 18 µm)* radius: full cone angle: 40° AFM Cantilevers:
Cantilever A shape: Beam length: 110 µm width: 32.5 µm thickness: 1 µm force constant: 1 N/m (0.1 - 4.6 N/m)* resonance frequency: 90 kHz (30 - 160 kHz)* Cantilever B shape: Beam length: 90 µm width: 32.5 µm thickness: 1 µm force constant: 2 N/m (0.2 - 9 N/m)* resonance frequency: 130 kHz (45 - 240 kHz)* Cantilever C shape: Beam length: 130 µm width: 32.5 µm thickness: 1 µm force constant: 0.6 N/m (0.06 - 2.7 N/m)* resonance frequency: 65 kHz (25 - 115 kHz)* * typical range
