Cantilever:
F: 13 kHz C: 0.2 N/m L: 450 µm
Applications:
Contact Mode AFM Probes
Description:
NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature. Aluminum Reflex CoatingThe aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
AFM Tip:
shape: Standard height: 10 - 15 µm radius: ( AFM Cantilever:
shape: Beam length: 450 µm (445 - 455 µm)* width: 50 µm (45 - 55 µm)* thickness: 2 µm (1.5 - 2.5 µm)* force constant: 0.2 N/m (0.07 - 0.4 N/m)* resonance frequency: 13 kHz (9 - 17 kHz)* * typical range
