nanoandmore/FESP/FESP-10/Box of 10 AFM Probes-蚂蚁淘生物

Cantilever:

F: 75 kHz C: 2.8 N/m L: 225 µm

Applications:

Force Modulation (FM) AFM ProbesNon-Contact / Soft Tapping Mode AFM Probes

Description:

NanoWorld PointProbe^®FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe.

All probes of the PointProbe^® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.Additionally, this probe offers an excellent tip radius of curvature.

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Uncoated

AFM Tip:

shape: Standard

height: 10 - 15 µm

radius: (

AFM Cantilever:

shape: Beam

length: 225 µm (220 - 230 µm)*

width: 28 µm (22.5 - 32.5 µm)*

thickness: 3 µm (2.5 - 3.5 µm)*

force constant: 2.8 N/m (1.2 - 5.5 N/m)*

resonance frequency: 75 kHz (60 - 90 kHz)*

* typical range This product features alignment grooves on the back side of the holder chip.

Cantilever:

Applications:

Description:

AFM Tip:

AFM Cantilever:

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