MikroMasch HQ Line Test Structures: PA01 and HOPG thumb
MikroMasch HQ Line Test Structures: PA01 and HOPG thumb
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NanoAndMore/PA01 Calibration Standard - NanoAndMore/PA01
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产品说明
PA01Tip Evaluation SampleProduct DescriptionSample for characterization of tip shape with hard sharp pyramidal nanostructures. The pyramids are triangular with base length in the range 50 – 100 nm and height 50 – 150 nm. The radius of curvature of the sharpest edges is below 5 nm.The structures of the PA01 are covered by a highly wear-resistant layer.pyramid base 50 - 100 nmpyramid height 50 - 150 nmsmallest edge radii < 5 nmactive area 5 x 5 mmchip dimensions 5 x 5 x 0.3 mmavailable mounted on 12 mm metal plate (PA01) or unmounted (PA01/NM)ApplicationThe exact shape of the scanning probe tip is very important for obtaining AFM images of high quality and accuracy. As new AFM tips with nanometer radii of curvature become widespread, periodic structures that have surface features of similar or greater sharpness should be used to estimate the parameters of the tip. An AFM image of the PA structures is shown above. The AFM image is obtained using an OPUS240AC-NA probe.

AFM 探针规格范围

在 NanoAndMore 投资组合中

  • 1原子力显微镜提示

    • 曲率半径: 1 - 20000 纳米

    • 高度: 2 - 50 微米

  • 2 AFM 悬臂

    • 共振频率: 6 - 5000 kHz

    • 力常数: 0.01 - 2000 牛/米

    • 长度: 7 - 500 微米

    • 宽度: 0.8 - 120 微米

    • 厚度: 0.08 - 7 µm

  • 3支撑芯片(搬运)

    • 方面: 1.6 毫米 x 3.4 毫米

* 上述属性范围以及 AFM 探针指南包括 NANOSENSORS™ 特殊开发列表 AFM 探针,这些 AFM 探针可能未列在 NanoAndMore 上的常规 AFM 探针范围内。如果您无法通过搜索字段找到您正在寻找的 AFM 探针,请与我们联系 - 我们将很乐意为您提供帮助!